These small particles eventually manifest themselves as some sort of contamination which causes some undesirable property in a finished product or manufacturing/industrial process. Often times, these particles are small enough to go unnoticed by the human eye. This is why the ability to characterize these small contaminants is so valuable. Microscopy and micro-analytical techniques can be used to characterize and identify what the material is, help in identifying the source of the unwanted contamination and its elimination.
Several of the techniques that allow us to characterize these materials include Polarized Light Microscopy (PLM), Scanning Electron Microscopy / Energy Dispersive Spectroscopy (SEM/EDS) and micro Fourier Transform Infrared Spectroscopy (µFTIR).
Silicon dioxide, or in this case, quartz sand is one of the most abundant compounds on Earth. This photomicrograph, presented here and on our homepage, was taken using polarized light at a magnification of 100X.
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